The X-ray photoelectron spectroscopy (XPS) technique, and lately also the time-of-flight secondary ion mass spectrometry (ToF-SIMS) technique, are essential for determining the surface properties of a ...

Instead, in this paper, our objective is to understand the metallurgical pathways for Pb leaching in a general context, based on the premise that no matter whether or how a pw-brass sample is pre-heat ...