Balancing yield and test is essential to semiconductor manufacturing, but it’s becoming harder to determine how much weight to give one versus the other as chips become more specialized for different ...

Parallel test is used for nearly every device produced by fabs and OSATs, but it can reduce yield and increase the cost of test boards and operations. This is a well-understood tradeoff for ensuring ...

JinkoSolar’s n-type TOPCon modules have been found to deliver significantly higher energy yield per watt compared to n-type BC modules during a three-month field test. The field test, conducted by TÜV ...