Abstract: A focused ion beam (FIB) based TEM lamella preparation technique specifically designed for high aspect ratio (HAR) samples, using generic E-beam compensatory carbon deposition method is ...
Abstract: A focal point in the identification of individual communication emitter of the same kind lies in extracting emitter fingerprint feature vectors with robust classification capabilities to ...
Thought LeadersProf. Dariusz Jarzabek & Martina SchenkelProfessor & Applications Development EngineerInstitute of Fundamental Technological Research & ZEISS In this interview, AZoNano speaks with ...
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