AZOM

The Focused Ion Beam Revolution: How FIB Instruments Transformed Sample Preparation

In recent decades, the preparation of samples for transmission electron microscopes has transformed, thanks to the introduction of focused ion beam (FIB) instruments. Known as either single-beam or ...
AZOM

Revolutionizing Cryo-Sample Preparation: High-Resolution Insights with Cryogenic FIB-SEM

Observations at the nanoscale can provide profound insights into materials science. Yet, the characterization of beam-sensitive and reactive materials has proven challenging. In order to address this ...
AZoNano

Combining Flexibility and Automation in FIB-SEM for TEM Lamella Preparation

Thought LeadersProf. Dariusz Jarzabek & Martina SchenkelProfessor & Applications Development EngineerInstitute of Fundamental Technological Research & ZEISS In this interview, AZoNano speaks with ...
AZoNano

TEM Lamella Preparation: Combine Flexibility and Automation using the ZEISS Crossbeam FIB-SEM

TEM lamella preparation is essential for almost any FIB-SEM user. Go beyond conventional TEM sample preparation with the ZEISS Crossbeam FIB-SEM. Users can maximize their productivity for TEM lamella ...
University of Wyoming

Wind River: FIB-SEM

CASI houses the Thermo Scientific Helios 5 UX DualBeam Focus Ion Beam/Scanning Electron Microscope (FIB-SEM) to accelerate nanotechnology research and development at the University of Wyoming. This ...
Michigan Technological University

FIB Form and Function 1

Unlike the electron beam used in scanning and transmission electron microscopy (SEM, TEM), the beam in a focused ion beam system (FIB) is composed of gallium (Ga) ions. The ions forming the structure ...
WFMZ-TV

Thermo Scientific Aquilos 2 Cryo-FIB Speeds Sample Preparation

HILLSBORO, Ore., Nov. 7, 2019 /PRNewswire/ -- Thermo Fisher Scientific today announced the Thermo Scientific Aquilos 2 Cryo-FIB, a DualBeam system dedicated to the preparation of thin, ...